Full Issue
Articles
-
DOI : https://doi.org/10.33557/jtekno.v18i1.1230 Abstract views : 185 , pdf : 120
-
DOI : https://doi.org/10.33557/jtekno.v18i1.1166 Abstract views : 2170 , pdf : 2212
-
DOI : https://doi.org/10.33557/jtekno.v18i1.1183 Abstract views : 251 , pdf : 381
-
DOI : https://doi.org/10.33557/jtekno.v18i1.1178 Abstract views : 134 , pdf : 131
-
DOI : https://doi.org/10.33557/jtekno.v18i1.1298 Abstract views : 327 , pdf : 427
-
DOI : https://doi.org/10.33557/jtekno.v18i1.1040 Abstract views : 381 , pdf : 373
-
DOI : https://doi.org/10.33557/jtekno.v18i1.1072 Abstract views : 351 , pdf : 1251
-
DOI : https://doi.org/10.33557/jtekno.v18i1.1207 Abstract views : 402 , pdf : 3703
-
DOI : https://doi.org/10.33557/jtekno.v18i1.1163 Abstract views : 441 , pdf : 429
-
DOI : https://doi.org/10.33557/jtekno.v18i1.1210 Abstract views : 2004 , pdf : 2977